WebFSM 128LC2C: Dedicated Film Stress mapping system with high resolution for high throughput process control. Fully automated cassette to cassette, SECS/GEM compliant … WebMay 1, 2024 · Stress Hysteresis Measurement up to 500C for thermal property and stability tests of thin films in inert gas. Non-Contact Laser Scanning Technology. ... FSM will be presenting at Semicon West in San Francisco, Ca, July 9-11, 2024. Please visit us at booth #243 in the South Hall.
Surface Stress Meter
WebFrontier Semiconductor Measurements, Inc. (FSM), 900TC-VAC, 209723. Impact. Impact. We create positive social impact by empowering people to innovate and invest for a better future. ... (FSM) 900TC-VAC. Stress Measurement. Metrology Equipment. Equipment details: Date of Manufacture: 2001. Currently Configured for: 300mm. Current Equipment ... WebWAFER TESTING AND METROLOGY Stress measurement system, 6" FSM Stress gauge 2005 vintage. ... FSM / FRONTIER SEMICONDUCTOR: 128 #293595237. WAFER TESTING AND METROLOGY Film stress measurement system, 8" Desktop computer Interface board Connection cable. More Details and Price . FSM / FRONTIER … compare the market advertising agency
FSM 128 Flatness system-FSM 128-Sitek Process Solutions Inc.
http://www.frontiersemi.com/center/products.php?productid=32 WebThe FSM 128 Series systems are room temperature, full-wafer 2D/3D stress mapping systems. 128 systems use FSM’s patented non-contact Opti-Lever dual-laser auto-switching technology featuring a micropositioning detector to measure the laser beam deflection with high precision over a large dynamic range of small to large bow or stress. WebFeatures. Unique capability to measure film stress to 900 degree C, options to 1100 C. Unique capability to measure out-gassing with a RGA unit during a heating cycle. Capable to measure wafers from 50 mm to 300 mm in diameters. Capable to pump down to 1E-6 torr to prevent film oxidation during heating. Fast and Simultaneous multiple metrology ... ebay reseller columbus ohio